Experimental fault characterization of a neural network /

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Bibliographic Details
Main Author: Tan, Chang-Huong.
Corporate Author: Langley Research Center.
Format: Government Document Microfilm Manuscript Book
Language:English
Published: [Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Series:NASA contractor report ; NASA CR-186885.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/LPS65381
connect to online version. (PDF)