Experimental fault characterization of a neural network /

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Bibliographic Details
Main Author: Tan, Chang-Huong.
Corporate Author: Langley Research Center.
Format: Government Document Microfilm Manuscript Book
Language:English
Published: [Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Series:NASA contractor report ; NASA CR-186885.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/LPS65381
connect to online version. (PDF)
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100 1 |a Tan, Chang-Huong. 
245 1 0 |a Experimental fault characterization of a neural network /  |c Chang-Huong Tan. 
260 |a [Urbana, Ill.] :  |b University of Illinois at Urbana-Champaign ;  |a [Hampton, Va.] :  |b [National Aeronautics and Space Administration, Langley Research Center] ;  |a [Springfield, Va.] :  |b [National Technical Information Service, distributor],  |c [1990] 
300 |a 1 volume. 
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338 |a microfiche  |b he  |2 rdacarrier 
490 1 |a NASA CR ;  |v 186885 
530 |a Also available via Internet from the NASA Technical Report Server web site. Address as of 11/30/05: http://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19900019057%5F1990019057.pdf ; current access is available via PURL. 
533 |a Microfiche.  |b [Washington, D.C. :  |c National Aeronautics and Space Administration,  |d 1990].  |e 2 microfiches. 
650 7 |a Classifications.  |2 nasat 
650 7 |a Defects.  |2 nasat 
650 7 |a Neural nets.  |2 nasat 
650 7 |a Simulation.  |2 nasat 
650 7 |a Systems analysis.  |2 nasat 
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