Experimental fault characterization of a neural network /

Bibliographic Details

Main Author:	Tan, Chang-Huong.
Corporate Author:	Langley Research Center.
Format:	Government Document Microfilm Manuscript Book
Language:	English
Published:	[Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Series:	NASA contractor report ; NASA CR-186885.
Subjects:	Classifications. Defects. Neural nets. Simulation. Systems analysis.
Online Access:	https://purl.fdlp.gov/GPO/LPS65381 connect to online version. (PDF)