Experimental fault characterization of a neural network /

Manylion Llyfryddiaeth

Prif Awdur:	Tan, Chang-Huong.
Awdur Corfforaethol:	Langley Research Center.
Fformat:	Government Document Microffilm Llawysgrif Llyfr
Iaith:	English
Cyhoeddwyd:	[Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Cyfres:	NASA contractor report ; NASA CR-186885.
Pynciau:	Classifications. Defects. Neural nets. Simulation. Systems analysis.
Mynediad Ar-lein:	https://purl.fdlp.gov/GPO/LPS65381 connect to online version. (PDF)