Experimental fault characterization of a neural network /

Guardado en:
Detalles Bibliográficos
Autor principal: Tan, Chang-Huong.
Autor Corporativo: Langley Research Center.
Formato: Documento de Gobierno Microfilme Manuscrito Libro
Lenguaje:English
Publicado: [Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Colección:NASA contractor report ; NASA CR-186885.
Materias:
Acceso en línea:https://purl.fdlp.gov/GPO/LPS65381
connect to online version. (PDF)