Experimental fault characterization of a neural network /

Gorde:
Xehetasun bibliografikoak
Egile nagusia: Tan, Chang-Huong.
Erakunde egilea: Langley Research Center.
Formatua: Government Document Mikrofilma Eskuizkribua Liburua
Hizkuntza:English
Argitaratua: [Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Saila:NASA contractor report ; NASA CR-186885.
Gaiak:
Sarrera elektronikoa:https://purl.fdlp.gov/GPO/LPS65381
connect to online version. (PDF)