Experimental fault characterization of a neural network /

Détails bibliographiques

Auteur principal:	Tan, Chang-Huong.
Collectivité auteur:	Langley Research Center.
Format:	Publication officielle Microfilm Manuscrit Livre
Langue:	English
Publié:	[Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Collection:	NASA contractor report ; NASA CR-186885.
Sujets:	Classifications. Defects. Neural nets. Simulation. Systems analysis.
Accès en ligne:	https://purl.fdlp.gov/GPO/LPS65381 connect to online version. (PDF)