Experimental fault characterization of a neural network /

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Bibliografische gegevens
Hoofdauteur: Tan, Chang-Huong.
Coauteur: Langley Research Center.
Formaat: Overheidsdocument Microfilm Manuscript Boek
Taal:English
Gepubliceerd in: [Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
Reeks:NASA contractor report ; NASA CR-186885.
Onderwerpen:
Online toegang:https://purl.fdlp.gov/GPO/LPS65381
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