Experimental fault characterization of a neural network /

Detalhes bibliográficos

Autor principal:	Tan, Chang-Huong.
Autor Corporativo:	Langley Research Center.
Formato:	Documento Governamental Microfilme Manuscrito Livro
Idioma:	English
Publicado em:	[Urbana, Ill.] : [Hampton, Va.] : [Springfield, Va.] : University of Illinois at Urbana-Champaign ; [National Aeronautics and Space Administration, Langley Research Center] ; [National Technical Information Service, distributor], [1990]
coleção:	NASA contractor report ; NASA CR-186885.
Assuntos:	Classifications. Defects. Neural nets. Simulation. Systems analysis.
Acesso em linha:	https://purl.fdlp.gov/GPO/LPS65381 connect to online version. (PDF)