Technologies for synthetic environments : hardware-in-the-loop testing VI : 16-18 April, 2001, Orlando, [Florida] USA /

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Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Murrer, Robert Lee
Format: Book
Language:English
Published: Bellingham, Wash. : SPIE, ©2001.
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4366.
Subjects:

RPI

Holdings details from RPI
Call Number: UG1310 .T43 2001