Showing
1 - 8
results of
8
for search '
'
Skip to content
Toggle navigation
VuFind
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
Reset Filters
Author:
Baaklini, George Y.
Call Number:
T - Technology
Institution:
Rensselaer Polytechnic Institute
Reset Filters
Show filters (3)
Author:
Baaklini, George Y.
Call Number:
T - Technology
Institution:
Rensselaer Polytechnic Institute
ConnectNY is ceasing participation in the ReShare Interlibrary Loan Service.
Please contact staff at your library about options for interlibrary loan services.
Search Results
Suggested Topics within your search.
Suggested Topics within your search.
Testing
8
Contrôle non destructif
7
Materials
7
Nondestructive testing
7
Composite materials
5
Essais
5
Matériaux
5
more ...
Surfaces (Technologie)
5
Surfaces (Technology)
5
Kongress
2
Microelectromechanical systems
2
Nanostructured materials
2
Zerstörungsfreie Werkstoffprüfung
2
COMPOSITE MATERIALS
1
CONFERENCES
1
Contrôle
1
Electrooptical devices
1
Evaluation
1
Évaluation
1
Fiabilité
1
MATERIALS
1
Microsystèmes électromécaniques
1
NONDESTRUCTIVE TESTS
1
Photonics
1
Qualité
1
Quality control
1
Reliability
1
SURFACES
1
TECHNOLOGY
1
TESTS
1
less ...
Showing
1 - 8
results of
8
for search '
'
, query time: 0.19s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA /
Published 2003
Call Number:
Loading...
Located:
Loading...
Book
Loading...
2
Nondestructive evaluation of materials and composites V : 7-8 March 2001, Newport Beach, USA /
Published 2001
Call Number:
Loading...
Located:
Loading...
Book
Loading...
3
Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach [Calif.], USA /
Published 2002
Call Number:
Loading...
Located:
Loading...
Book
Loading...
4
Nondestructive methods for materials characterization /
Published 2000
Call Number:
Loading...
Located:
Loading...
Book
Loading...
5
Nondestructive evaluation of materials and composites : 3-5 December 1996, Scottsdale, Arizona /
Published 1996
Call Number:
Loading...
Located:
Loading...
Book
Loading...
6
Nondestructive evaluation of materials and composites II : 31 March-1 April 1998, San Antonio, Texas /
Published 1998
Call Number:
Loading...
Located:
Loading...
Book
Loading...
7
Nondestructive evaluation of aging materials and composites III : 3-5 March 1999, Newport Beach, California /
Published 1999
Call Number:
Loading...
Located:
Loading...
Book
Loading...
8
Nondestructive evaluation of aging materials and composites IV : 8-9 March, 2000, Newport Beach, California, USA /
Published 2000
Call Number:
Loading...
Located:
Loading...
Book
Loading...
Search Tools:
Get RSS Feed
—
Email this Search
Back
Narrow Search
Format
Book
8
Year of Publication
From:
To:
Author
Baaklini, George Y.
Society of Photo-optical Instrumentation Engineers
7
Lebowitz, Carol A.
4
Boltz, Eric S.
2
Doctor, S. R.
2
Meyendorf, Norbert
2
more ...
Michel, Bernd, 1949-
2
National Institute of Standards and Technology (U.S.)
2
American Society for Nondestructive Testing
1
Institute for Acoustic Microscopy
1
Nihon Hi Hakai Kensa Kyōkai
1
Society for Experimental Mechanics (U.S.)
1
see all ...
less ...
Call Number
T - Technology
Genre
Conference papers and proceedings
8
Congresses
8
Congrès
7
Konferenzschrift
1
Newport Beach (Calif., 1999)
1
San Antonio (Tex., 1998)
1
Suggested Topics
Testing
8
Contrôle non destructif
7
Materials
7
Nondestructive testing
7
Composite materials
5
Essais
5
more ...
Matériaux
5
Surfaces (Technologie)
5
Surfaces (Technology)
5
Kongress
2
Microelectromechanical systems
2
Nanostructured materials
2
Zerstörungsfreie Werkstoffprüfung
2
COMPOSITE MATERIALS
1
CONFERENCES
1
Contrôle
1
Electrooptical devices
1
Evaluation
1
Évaluation
1
Fiabilité
1
MATERIALS
1
Microsystèmes électromécaniques
1
NONDESTRUCTIVE TESTS
1
Photonics
1
Qualité
1
Quality control
1
Reliability
1
SURFACES
1
TECHNOLOGY
1
TESTS
1
see all ...
less ...
Era
1998
1
Region
San Antonio, Texas
1
Institution
Rensselaer Polytechnic Institute
Language
English
8
Loading...