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European Optical Society
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T - Technology
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Testing
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Author:
European Optical Society
Call Number:
T - Technology
Format:
Book
Suggested Topics:
Testing
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Analysis
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Optical design and engineering : 30 September-3 October, 2003, St. Etienne, France /
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In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
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Optical fabrication, testing and metrology : 30 September-3 October 2003 /
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Integrated optical devices : fabrication and testing : 30 October-1 November 2002, Brugge, Belgium /
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Fiber-based component fabrication, testing and connectorization : 29-30 October 2002, Brugge, Belgium /
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Optical fabrication and testing : 26-28 May 1999, Berlin, Germany /
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European Optical Society
Society of Photo-optical Instrumentation Engineers
6
Geyl, Roland
2
Groupement des industries française d'optique
2
Société française d'optique
2
Commission of the European Communities. Directorate-General for Science, Research, and Development
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Dahlgren, Robert P. (Robert Paul), 1960-
1
Institution of Electrical Engineers
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Kissinger, Gudrun
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Maxwell, Jonathan
1
Mazuray, Laurent
1
Pruneri, Valerio
1
Righini, Giancarlo C.
1
Rimmer, David
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Rogers, Philip J.
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Sanger, Gregory M.
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Scottish Enterprise
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Wang, Lingli
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Wartmann, Rolf
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Weiland, Larg H.
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Call Number
T - Technology
Genre
Conference papers and proceedings
6
Congresses
6
Congrès
5
Suggested Topics
Design and construction
6
Testing
Optical instruments
3
Materials
2
Matériaux optiques
2
Optical materials
2
more ...
Analyse
1
Analysis
1
Caractérisation
1
Characterization
1
Connecteurs
1
Contrôle
1
Diffraction gratings
1
Dispositifs optoélectroniques
1
Fabrication
1
Fiabilité
1
Fibres optiques
1
Fotônica
1
Integrated circuits
1
Integrated optics
1
Joints
1
Manufacturing processes
1
Matériaux
1
Metrology
1
Métrologie
1
Microelectronics
1
Microélectronique
1
Optical fiber detectors
1
Optical fibers
1
Optique intégrée
1
see all ...
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Institution
Rensselaer Polytechnic Institute
6
Language
English
6
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