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Institution of Electrical Engineers
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Society of Photo-optical Instrumentation Engineers
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T - Technology
Genre:
Conference papers and proceedings
Suggested Topics:
Integrated circuits
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Author:
Institution of Electrical Engineers
AND
Society of Photo-optical Instrumentation Engineers
Call Number:
T - Technology
Genre:
Conference papers and proceedings
Suggested Topics:
Integrated circuits
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Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /
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In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
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Lithography for semiconductor manufacturing II : 30 May-1 June, 2001, Edinburgh, UK /
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In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
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European Optical Society
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Amberiadis, Kostas
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European Commission. Directorate-General XII, Science, Research, and Development
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Call Number
T - Technology
Genre
Conference papers and proceedings
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Design and construction
4
Integrated circuits
Very large scale integration
4
Contrôle
3
Materials
3
Microelectronics
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Microélectronique
3
Semiconductors
3
Fabrication
2
Industrie
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Matériaux
2
Microelectronics industry
2
Production
2
Production control
2
Qualité
2
Quality control
2
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1
Analysis
1
Caractérisation
1
Characterization
1
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Circuits intégrés à très grande échelle
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Fiabilité
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Lithographie
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Lithography
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Microlithography
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Printed circuits
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Reliability
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Rensselaer Polytechnic Institute
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