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Author:
Kissinger, Gudrun
AND
Society of Photo-optical Instrumentation Engineers
Call Number:
T - Technology
Institution:
Rensselaer Polytechnic Institute
Suggested Topics:
Testing
AND
Very large scale integration
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Author:
Kissinger, Gudrun
AND
Society of Photo-optical Instrumentation Engineers
Call Number:
T - Technology
Institution:
Rensselaer Polytechnic Institute
Suggested Topics:
Testing
AND
Very large scale integration
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In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
Published 2001
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