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2
Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China /
Published 2001
Conference Proceeding Book
3
Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA /
Published 2002
Book
4
Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /
Published 2001
Book
7
Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA /
Published 2003
Book
8
Microelectronics technology and process integration : 20-21 October 1994, Austin, Texas /
Published 1994
Book
9
Manufacturing process control for microelectronic devices and circuits : 20-21 October 1994, Austin, Texas /
Published 1994
Book
10
Microelectronic manufacturing yield, reliability, and failure analysis : 25-26 October 1995, Austin, Texas /
Published 1995
Book
13
Process and equipment control in microelectronic manufacturing : 19-20 May, 1999, Edinburgh, Scotland /
Published 1999
Book
14
Process module metrology, control, and clustering : 11-13 September 1991, San Jose, California /
Published 1992
Conference Proceeding Book
15
International Conference of Microelectronics--Microelectronics '92 : 21-23 September 1992, Warsaw, Poland /
Published 1992
Conference Proceeding Book
16
Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas /
Published 1997
Book
19
Microelectronic manufacturing yield, reliability, and failure analysis II : 16-17 October, 1996, Austin, Texas /
Published 1996
Book
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