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1

Memory, LSI, linear IC : digest of papers /

Memory, LSI, linear IC : digest of papers /

Published 1975

Conference Proceeding Book

2

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1976

Conference Proceeding Book

3

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1977

Conference Proceeding Book

4

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Published 1987

Conference Proceeding Book

5

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Published 1985

Conference Proceeding Book

6

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Published 1986

Conference Proceeding Book

7

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Sect...

Published 1974

Conference Proceeding Book