Search Results

1

Reliability, testing, and characterization of MEMS/MOEMS II : 27-29 January 2003, San Jose, California, USA /

Reliability, testing, and characterization of MEMS/MOEMS II : 27-29 January 2003, San Jose, California, USA /

Published 2003

Book

2

Contemporary topics in in situ testing, analysis, and reliability of foundations : selected papers from the 2009 International Foundation Congress and Equipment Expo, March 15-19, 2009, Orlando, Florida /

Contemporary topics in in situ testing, analysis, and reliability of foundations : selected papers from the 2009 International Foundation Congress and Equipment Expo, March 15-19,...

Published 2009

Conference Proceeding Book

3

Mechanical fault diagnosis and condition monitoring /

Mechanical fault diagnosis and condition monitoring /

by Collacott, Ralph A. (Ralph Albert), 1918-
Published 1977

Book

4

Reliability physics : 8th annual proceedings, Las Vegas, Nevada, April 7-10, 1970 /

Reliability physics : 8th annual proceedings, Las Vegas, Nevada, April 7-10, 1970 /

Published 1971

Conference Proceeding Book

5

Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, [California] USA /

Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, [California] USA /

Published 2002

Book

6

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

7

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Francisco [Calif.], USA /

Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Francisco [Calif.], USA /

Published 2001

Book

8

Reliability, testing, and characterization of MEMS/MOEMS III : 26-28 January, 2004, San Jose, California, USA /

Reliability, testing, and characterization of MEMS/MOEMS III : 26-28 January, 2004, San Jose, California, USA /

Published 2004

Book

9

Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach [Calif.], USA /

Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach [Calif.], USA /

Published 2002

Book

10

Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA /

Test and measurement applications of optoelectronic devices : 21-22 January, 2002, San Jose, USA /

Published 2002

Book

11

Test and evaluation of the tactical missile /

Test and evaluation of the tactical missile /

Published 1989

Book

12

Optical network engineering and integrity : 24-25 October 1995, Philadelphia, Pennsylvania /

Optical network engineering and integrity : 24-25 October 1995, Philadelphia, Pennsylvania /

Published 1996

Book

13

Laser testing and reliability : 7 November 1991, San Jose, California /

Laser testing and reliability : 7 November 1991, San Jose, California /

Published 1992

Book

14

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. /

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A. /

Published 1993

Book

15

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Published 1998

Book

16

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /

Published 1991

Conference Proceeding Book

17

Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A. /

Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A. /

Published 1999

Book

18

Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A. /

Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A. /

Published 1997

Book

19

Fiber optics reliability and testing : benign and adverse environments : sixth in a series : 8-10 September 1993, Boston, Massachusetts /

Fiber optics reliability and testing : benign and adverse environments : sixth in a series : 8-10 September 1993, Boston, Massachusetts /

Published 1994

Book

20

Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. /

Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A. /

Published 1994

Book

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