Search Results

1

VCSELs and optical interconnects : 30 October-1 November 2002, Brugge, Belgium /

VCSELs and optical interconnects : 30 October-1 November 2002, Brugge, Belgium /

Published 2003

Book

2

Laser micromachining for optoelectronic device fabrication : 30 October 2002, Brugge, Belgium /

Laser micromachining for optoelectronic device fabrication : 30 October 2002, Brugge, Belgium /

Published 2003

Book

3

Photonics for space and radiation environments II : 17-18 September, 2001, Toulouse, France /

Photonics for space and radiation environments II : 17-18 September, 2001, Toulouse, France /

Published 2002

Conference Proceeding Book

4

Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany /

Microsystems engineering : metrology and inspection III : 23-25 June, 2003, Munich, Germany /

Published 2003

Book

5

Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June, 2001, Munich, Germany /

Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June, 2001, Munich, Germany /

Published 2001

Book

6

Optical measurement systems for industrial inspection II : applications in production engineering : 20-21 June, 2001, Munich, Germany /

Optical measurement systems for industrial inspection II : applications in production engineering : 20-21 June, 2001, Munich, Germany /

Published 2001

Book

7

Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France /

Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France /

Published 2001

Book

8

SAR image analysis, modeling, and techniques IV : 17-18 September, 2001, Toulouse, France /

SAR image analysis, modeling, and techniques IV : 17-18 September, 2001, Toulouse, France /

Published 2002

Book

9

Reliability of optical fiber components, devices, systems and networks : 28-29 October, 2002, Brugge, Belgium /

Reliability of optical fiber components, devices, systems and networks : 28-29 October, 2002, Brugge, Belgium /

Published 2003

Book

10

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany /

Optical measurement systems for industrial inspection III : 23-26 June 2003, Munich, Germany /

Published 2003

Book

11

MEMS/MOEMS : advances in photonic communications, sensing, metrology, packaging and assembly : 28-29 October 2002, Brugge, Belgium /

MEMS/MOEMS : advances in photonic communications, sensing, metrology, packaging and assembly : 28-29 October 2002, Brugge, Belgium /

Published 2003

Book

12

Transducing materials and devices : 30 October-1 November, 2002, Brugge, Belgium /

Transducing materials and devices : 30 October-1 November, 2002, Brugge, Belgium /

Published 2003

Book

13

Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /

Process and equipment control in microelectronic manufacturing II : 30-31 May 2001, Edinburgh, UK /

Published 2001

Book

14

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

15

MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK /

MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

16

Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany /

Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany /

Published 2001

Book

17

Laser radar ranging and atmospheric lidar techniques III : 17-18 September, 2001, Toulouse, France /

Laser radar ranging and atmospheric lidar techniques III : 17-18 September, 2001, Toulouse, France /

Published 2002

Book

18

SAR image analysis, modeling, and techniques VI : 8 September, 2003, Barcelona, Spain /

SAR image analysis, modeling, and techniques VI : 8 September, 2003, Barcelona, Spain /

Published 2004

Book

19

Optical fabrication, testing and metrology : 30 September-3 October 2003 /

Optical fabrication, testing and metrology : 30 September-3 October 2003 /

Published 2004

Book

20

Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France /

Detectors and associated signal processing : 1-2 October 2003, St. Etienne, France /

Published 2004

Book

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