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T - Technology
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Kongress
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Metallizing
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Mechanical properties materials design : proceedings of the symposia J, Fatigue and fracture behavior in materials, K, Recent advances of tribomaterials, and M, Microstructures and...
Published 1991
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Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. /
Published 1996
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Microstructural investigation and analysis /
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Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A. /
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Materials reliability in microelectronics VII : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A. /
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Microstructural processes in irradiated materials : symposium held November 30-December 2, 1998, Boston, Massachusetts, U.S.A. /
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Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A. /
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Microstructural processes in irradiated materials-- 2000 : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A. /
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8
Conference Proceeding
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Brown, Dirk D.
1
C-MRS International Conference Beijing, China
1
Clement, J. Joseph
1
Deutsche Gesellschaft für Materialkunde
1
European Conference on Advanced Materials and Processes Munich, Germany
1
Federation of European Materials Societies
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Filter, William F.
1
Garboczi, Edward J.
1
Gerhardt, Rosario A., 1953-
1
Jouffrey, Bernard
1
Lucas, Glenn E., 1951-
1
Svejcar, J.
1
Taylor, S. R. (S. Ray), 1953-
1
Verbruggen, Ad H.
1
Volkert, Cynthia A.
1
Wu, Boqun
1
Zhongguo cai liao yan jiu xue hui
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Zinkle, Steven John
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T - Technology
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8
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San Francisco (Calif., 1997)
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Suggested Topics
Kongress
Materials
Microstructure
8
Microstructure (Physique)
Matériaux
5
Mikrostruktur
5
more ...
Werkstoff
5
Fiabilité
3
Metallizing
3
Métallisation
3
Microelectronics
3
Microélectronique
3
Mikroelektronik
3
Reliability
3
Testing
3
Zuverlässigkeit
3
Effect of radiation on
2
Effets du rayonnement sur
2
Analyse
1
Analysis
1
Bestrahlung
1
Fatigue
1
Fracture mechanics
1
Kongreß
1
Mechanical wear
1
Mechanische Eigenschaft
1
Mécanique de la rupture
1
Microscopie
1
Microscopy
1
Semicondutores
1
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1995
1
1996
1
1998
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1999
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2000
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3
München
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San Francisco (Calif.)
1
Institution
Rensselaer Polytechnic Institute
8
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