Showing
1 - 2
results of
2
for search '
'
Skip to content
Toggle navigation
VuFind
Your Account
Log Out
Login
Language
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文(繁體)
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Find
Advanced
Reset Filters
Call Number:
T - Technology
Suggested Topics:
Integrated circuits
Author:
Institute of Electrical and Electronics Engineers. Philadelphia Section
Genre:
Actes de congrès
Reset Filters
Show filters (4)
Call Number:
T - Technology
Suggested Topics:
Integrated circuits
Author:
Institute of Electrical and Electronics Engineers. Philadelphia Section
Genre:
Actes de congrès
Search Results
Suggested Topics within your search.
Suggested Topics within your search.
Essais
2
Integrated circuits
Semi-conducteurs
2
Semiconductors
2
Testing
2
Showing
1 - 2
results of
2
for search '
'
, query time: 0.04s
Refine Results
Sort
Relevance
Date Descending
Date Ascending
Call Number
Author
Title
1
The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /
Published 1985
Call Number:
Loading...
Located:
Loading...
//IF NOT LOGGED IN - FORCE LOGIN ?>
Request
//ELSE THEY ARE LOGGED IN PROCEED WITH THE OPEN URL CODE:?>
Conference Proceeding
Book
Save to List
Saved in:
2
The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /
Published 1984
Call Number:
Loading...
Located:
Loading...
//IF NOT LOGGED IN - FORCE LOGIN ?>
Request
//ELSE THEY ARE LOGGED IN PROCEED WITH THE OPEN URL CODE:?>
Conference Proceeding
Book
Save to List
Saved in:
Search Tools:
Get RSS Feed
—
Email this Search
—
Save Search
Back
Narrow Search
Format
Book
2
Conference Proceeding
2
Year of Publication
From:
To:
Author
Institute of Electrical and Electronics Engineers. Philadelphia Section
International Test Conference Philadelphia, Pa
2
IEEE Computer Society
1
IEEE Computer Society. Test Technology Committee
1
Call Number
T - Technology
Genre
Actes de congrès
Conference papers and proceedings
2
Congresses
2
Congrès
2
Congress
1
Suggested Topics
Essais
2
Integrated circuits
Semi-conducteurs
2
Semiconductors
2
Testing
2
Institution
Rensselaer Polytechnic Institute
2
Language
English
2
Loading...