Search Results

1

Memory, LSI, linear IC : digest of papers /

Memory, LSI, linear IC : digest of papers /

Published 1975

Conference Proceeding Book

2

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1976

Conference Proceeding Book

3

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1977

Conference Proceeding Book

4

Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989.

Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989.

Published 1989

Conference Proceeding Book

5

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Published 1983

Conference Proceeding Book

6

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Published 1987

Conference Proceeding Book

7

Tutorial test generation for VLSI chips /

Tutorial test generation for VLSI chips /

Published 1988

Book

8

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Published 1985

Conference Proceeding Book

9

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Published 1986

Conference Proceeding Book

10

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /

Quality productivity profit : digest of papers : 1982 International Test Conference, November 15-18, 1982 /

Published 1982

Conference Proceeding Book

11

1997 IEEE/ACM International Conference on Computer-Aided Design, November 9-13, 1997 San Jose, California : digest of technical papers.

1997 IEEE/ACM International Conference on Computer-Aided Design, November 9-13, 1997 San Jose, California : digest of technical papers.

Published 1997

Conference Proceeding Book

12

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Sect...

Published 1974

Conference Proceeding Book

13

Proceedings /

Published 1986

Conference Proceeding Book

14

Tutorial, test generation for VLSI chips /

Tutorial, test generation for VLSI chips /

by Agrawal, Vishwani D.
Published 1988

Book

15

Digest of papers /

Digest of papers /

Published 1981

Conference Proceeding

16

Digest of papers /

Digest of papers /

Conference Proceeding

17

Proceedings. --

Proceedings. --

Published 1981

Conference Proceeding

18

Curriculum for test technology : [held at] M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Curriculum for test technology : [held at] M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Published 1984

Book