Search Results

1

Memory, LSI, linear IC : digest of papers /

Memory, LSI, linear IC : digest of papers /

Published 1975

Conference Proceeding Book

2

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1976

Conference Proceeding Book

3

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey /

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey /

Published 1978

Conference Proceeding Book

4

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1977

Conference Proceeding Book

5

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Published 1987

Conference Proceeding Book

6

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Published 1983

Conference Proceeding Book

7

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Published 1985

Conference Proceeding Book

8

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Published 1986

Conference Proceeding Book

9

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /

The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 /

Published 1984

Conference Proceeding Book

10

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

Testing in the 1980's : digest of papers, 1981 International Test Conference, October 27, 28 & 29, 1981 /

Published 1981

Conference Proceeding Book

11

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey /

Published 1979

Conference Proceeding Book

12

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /

Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 /

Published 1980

Conference Proceeding Book

13

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey /

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey /

Published 1993

Conference Proceeding Book

14

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Sect...

Published 1974

Conference Proceeding Book

15

Proceedings /

Published 1983

Conference Proceeding