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T - Technology
Suggested Topics:
Testing
AND
Very large scale integration
Author:
Society of Photo-optical Instrumentation Engineers
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Call Number:
T - Technology
Suggested Topics:
Testing
AND
Very large scale integration
Author:
Society of Photo-optical Instrumentation Engineers
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Fiabilité
4
Integrated circuits
4
Reliability
4
Testing
Very large scale integration
Microelectronics
3
Microélectronique
3
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Circuits intégrés
2
Circuits intégrés à très grande échelle
2
Design and construction
2
Analyse
1
Analysis
1
Caractérisation
1
Characterization
1
Contrôle
1
Couches minces métalliques
1
Defects
1
Défauts
1
Fabrication
1
Fault tolerance
1
Halbleitertechnologie
1
Integrierte Schaltung
1
Kongress
1
Kongreß
1
Manufacturing processes
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Materials
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In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /
Published 2001
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Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /
Published 1998
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Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /
Published 1991
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Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas /
Published 1997
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Format
Book
4
Conference Proceeding
1
Year of Publication
From:
To:
Author
Society of Photo-optical Instrumentation Engineers
Hartmann, Hans-Dieter
2
Prasad, Sharad
2
Ali Keshavarzi
1
Electrochemical Society
1
European Optical Society
1
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Gildenblat, Gennady Sh
1
Institution of Electrical Engineers
1
Kissinger, Gudrun
1
Schwartz, Gary P.
1
Scottish Enterprise
1
Semiconductor Equipment and Materials International
1
Solid State Technology (Organization)
1
Symposium on Microelectronic Processing Integration
1
Tsujide, Tohru
1
Weiland, Larg H.
1
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Call Number
T - Technology
Genre
Conference papers and proceedings
4
Congresses
4
Congrès
4
San Jose (Calif., 1991)
1
Santa Clara (Calif., 1998)
1
Suggested Topics
Fiabilité
4
Integrated circuits
4
Reliability
4
Testing
Very large scale integration
Microelectronics
3
more ...
Microélectronique
3
Circuits intégrés
2
Circuits intégrés à très grande échelle
2
Design and construction
2
Analyse
1
Analysis
1
Caractérisation
1
Characterization
1
Contrôle
1
Couches minces métalliques
1
Defects
1
Défauts
1
Fabrication
1
Fault tolerance
1
Halbleitertechnologie
1
Integrierte Schaltung
1
Kongress
1
Kongreß
1
Manufacturing processes
1
Materials
1
Metallic films
1
Metallisieren
1
Metallizing
1
Métallisation
1
see all ...
less ...
Institution
Rensselaer Polytechnic Institute
4
Language
English
4
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