Search Results

1

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

2

Formal methods for VLSI design : IFIP WG 10.5 lecture notes /

Formal methods for VLSI design : IFIP WG 10.5 lecture notes /

Published 1990

Book

3

Tutorial test generation for VLSI chips /

Tutorial test generation for VLSI chips /

Published 1988

Book

4

Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

by Cheng, Kwang-Ting, 1961-
Published 1989

Book

5

LSI/VLSI testability design /

LSI/VLSI testability design /

by Tsui, Frank F.
Published 1987

Book

6

Introduction to VLSI testing /

Introduction to VLSI testing /

by Feugate, Robert J., 1946-
Published 1988

Book

7

VLSI testing : digital and mixed analogue/digital techniques /

VLSI testing : digital and mixed analogue/digital techniques /

by Hurst, S. L. (Stanley Leonard)
Published 1998

Book

8

From contamination to defects, faults, and yield loss : simulation and applications /

From contamination to defects, faults, and yield loss : simulation and applications /

by Khare, Jitendra B.
Published 1996

Book

9

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Published 1998

Book

10

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /

Metallization : performance and reliability issues for VLSI and ULSI : 12-13 September 1991, San Jose, California /

Published 1991

Conference Proceeding Book

11

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey /

Digest of papers : Eleventh Annual 1993 IEEE VLSI Test Symposium, April 6-8, 1993, Atlantic City, New Jersey /

Published 1993

Conference Proceeding Book

12

VLSI fault modeling and testing techniques /

VLSI fault modeling and testing techniques /

Published 1993

Book

13

Self-testing VLSI design /

Self-testing VLSI design /

by I︠A︡rmolik, V. N. (Vi︠a︡cheslav Nikolaevich)
Published 1993

Book

14

Design & test techniques for VLSI & WSI circuits /

Design & test techniques for VLSI & WSI circuits /

Published 1989

Book

15

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas /

Microelectronic manufacturing yield, reliability, and failure analysis III : 1-2 October, 1997, Austin, Texas /

Published 1997

Book

16

High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

by Lee, Mike Tien-Chien
Published 1997

Book

17

Formal methods in circuit design /

Formal methods in circuit design /

by Stavridou, V. (Victoria)
Published 1993

Book

18

VLSI testing /

Published 1986

Book

19

Testing and diagnosis of VLSI and ULSI /

Testing and diagnosis of VLSI and ULSI /

Published 1988

Conference Proceeding Book