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Institution:
Rensselaer Polytechnic Institute
Suggested Topics:
Defects
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Integrated circuits
AND
Testing
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Format:
Book
Institution:
Rensselaer Polytechnic Institute
Suggested Topics:
Defects
AND
Integrated circuits
AND
Testing
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Circuits intégrés à très grande échelle
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Defects
Défauts
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Integrierte Schaltung
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Testing
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From contamination to defects, faults, and yield loss : simulation and applications /
by
Khare, Jitendra B.
Published 1996
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Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /
Published 1998
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Hartmann, Hans-Dieter
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Suggested Topics
Circuits intégrés à très grande échelle
2
Defects
Défauts
2
Integrated circuits
Integrierte Schaltung
2
Testing
more ...
Very large scale integration
2
Circuits intégrés
1
Computer simulation
1
Computer-Aided Design
1
Computer-aided design
1
Conception assistée par ordinateur
1
Fehlererkennung
1
Fehlersimulation
1
Fiabilité
1
Kongress
1
Microelectronics
1
Microélectronique
1
Reliability
1
Simulation par ordinateur
1
Zuverlässigkeit
1
computer-aided designs (visual works)
1
see all ...
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Rensselaer Polytechnic Institute
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