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2
Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA /
Published 2002
Book
5
Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA /
Published 2003
Book
6
From contamination to defects, faults, and yield loss : simulation and applications /
by Khare, Jitendra B.
Published 1996
Book
8
Integrated circuit defect-sensitivity : theory and computational models /
by Pineda de Gyvez, José
Published 1993
Book
9
Stress-induced phenomena in metallization : first international workshop, Ithaca, NY, 1991 /
Published 1992
Conference Proceeding Book
10
Stress-induced phenomena in metallization : second international workshop, Austin, TX, March 1993 /
Published 1994
Conference Proceeding Book
11
Yield simulation for integrated circuits /
by Walker, Duncan Moore Henry
Published 1987
Book
12
Stress induced phenomena in metallization : fourth international workshop, Tokyo, Japan, June, 1997 /
Published 1998
Conference Proceeding Book
13
High speed VLSI interconnections : modeling, analysis, and simulation /
by Goel, Ashok K., 1953-
Published 1994
Book
14
Statistical approach to VLSI /
Published 1994
Book
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