Search Results

1

ATFA-77, advanced techniques in failure analysis : proceedings [of a symposium] held 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA /

ATFA-77, advanced techniques in failure analysis : proceedings [of a symposium] held 27-29 September 1977 : Airport Marriott Hotel, Los Angeles, California USA /

Published 1977

Book

2

Planar test structures for characterizing impurities in silicon /

Planar test structures for characterizing impurities in silicon /

Published 1976

Government Document Book

3

Proceedings /

Published 1976

Conference Proceeding Book

4

From contamination to defects, faults, and yield loss : simulation and applications /

From contamination to defects, faults, and yield loss : simulation and applications /

by Khare, Jitendra B.
Published 1996

Book

5

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /

Published 1998

Book

6

Quality conformance and qualification of microelectronic packages and interconnects /

Quality conformance and qualification of microelectronic packages and interconnects /

Published 1994

Book

7

Development and evaluation of an intrinsic gettering process for fabrication of integrated circuits /

Development and evaluation of an intrinsic gettering process for fabrication of integrated circuits /

by Will, James A., II
Published 2000

Thesis Book

8

Nondestructive evaluation and flaw criticality for composite materials : a symposium /

Nondestructive evaluation and flaw criticality for composite materials : a symposium /

Published 1979

Book

9

Effect of die cutting on polymeric materials /

Effect of die cutting on polymeric materials /

by Jain, Pushpak
Published 2007

Thesis Book

10

Permanent/durable book paper; summary.

Permanent/durable book paper; summary.

Published 1960

Conference Proceeding Book