Search Results

1

Photo-excited processes, diagnostics, and applications : fundamentals and advanced topics /

Photo-excited processes, diagnostics, and applications : fundamentals and advanced topics /

Published 2003

Book

2

Memory, LSI, linear IC : digest of papers /

Memory, LSI, linear IC : digest of papers /

Published 1975

Conference Proceeding Book

3

A production-compatible microelectronic test pattern for evaluating photomask misalignment /

A production-compatible microelectronic test pattern for evaluating photomask misalignment /

by Russell, T. J. (Thomas James), 1943-, Maxwell, Dwight A.
Published 1979

Government Document Book

4

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1976

Conference Proceeding Book

5

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey /

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey /

Published 1978

Conference Proceeding Book

6

Memory & LSI : digest of papers /

Memory & LSI : digest of papers /

Published 1977

Conference Proceeding Book

7

Metrology for submicrometer devices and circuits /

Metrology for submicrometer devices and circuits /

by Bullis, W. Murray, 1930-
Published 1980

Government Document Book

8

Techniques for measuring the integrity of passivation overcoats on integrated circuits /

Techniques for measuring the integrity of passivation overcoats on integrated circuits /

by Kern, Werner, 1925-, Comizzoli, Robert B.
Published 1977

Government Document Book

9

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

10

Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989.

Proceedings of the 1st European Test Conference, Paris, April 12-14, 1989.

Published 1989

Conference Proceeding Book

11

Formal methods for VLSI design : IFIP WG 10.5 lecture notes /

Formal methods for VLSI design : IFIP WG 10.5 lecture notes /

Published 1990

Book

12

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983 /

Published 1983

Conference Proceeding Book

13

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Integration of test with design and manufacturing : proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C. /

Published 1987

Conference Proceeding Book

14

Tutorial test generation for VLSI chips /

Tutorial test generation for VLSI chips /

Published 1988

Book

15

Unified methods for VLSI simulation and test generation /

Unified methods for VLSI simulation and test generation /

by Cheng, Kwang-Ting, 1961-
Published 1989

Book

16

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983 /

Published 1983

Conference Proceeding Book

17

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /

Micron and submicron integrated circuit metrology : August 22-23, 1985, San Diego, California /

Published 1985

Book

18

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

The future of test : International Test Conference, 1985 proceedings, November 19, 20, 21, 1985 /

Published 1985

Conference Proceeding Book

19

LSI/VLSI testability design /

LSI/VLSI testability design /

by Tsui, Frank F.
Published 1987

Book

20

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Testing's impact on design & technology : International Test Conference, 1986, proceedings, September 8, 9, 10, 11, 1986 /

Published 1986

Conference Proceeding Book

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