Search Results

1

Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA /

Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA /

Published 2004

Book

2

Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA /

Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA /

Published 2002

Book

3

Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003, Santa Clara, California, USA /

Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003, Santa Clara, California, USA /

Published 2003

Book

4

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK /

Published 2001

Book

5

Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA /

Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA /

Published 2003

Book

6

Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA /

Cost and performance in integrated circuit creation : 27-28 February 2003, Santa Clara, California, USA /

Published 2003

Book

7

Microelectronics manufacturing diagnostics handbook /

Microelectronics manufacturing diagnostics handbook /

Published 1993

Book

8

In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland /

In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland /

Published 1999

Book

9

On-chip probe metrology /

On-chip probe metrology /

by Farner, William Robert
Published 2008

Thesis Book

10

X-ray metrology in semiconductor manufacturing /

X-ray metrology in semiconductor manufacturing /

by Bowen, D. Keith (David Keith), 1940-
Published 2006

Book