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Signatura:
T - Technology
Avtor:
American Society for Testing and Materials
IN
Symposium on Special Applications and Advanced Techniques for Crack Size Determination
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Kongress
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Signatura:
T - Technology
Avtor:
American Society for Testing and Materials
IN
Symposium on Special Applications and Advanced Techniques for Crack Size Determination
Priporočene teme:
Kongress
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Special applications and advanced techniques for crack size determination /
Izdano 1995
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American Society for Testing and Materials
Donald, J. Keith, 1949-
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Ruschau, John J., 1950-
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Symposium on Special Applications and Advanced Techniques for Crack Size Determination
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T - Technology
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Atlanta (Ga., 1993)
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Cracking
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1993
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Atlanta (Ga.)
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Rensselaer Polytechnic Institute
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