Resultats de la cerca

1

EDA for IC implementation, circuit design, and process technology /

Publicat 2006

Llibre

2

EDA for IC system design, verification, and testing /

Publicat 2006

Llibre

3

Fundamentals of semiconductor manufacturing and process control /

per May, Gary S.
Publicat 2006

Llibre

4

Motion estimation for video coding : efficient algorithms and architectures /

per Chakrabarti, Indrajit, Batta, Kota Naga Srinivasarao, Chatterjee, Sumit Kumar
Publicat 2015

Llibre

5

19th European Conference on Mask Technology for Integrated Circuits and Microcomponents, 13-15 January, 2003, Sonthofen, Germany /

Publicat 2003

Actes de congresos Llibre

6

Metrology, inspection, and process control for microlithography XVII : 24-27 February, 2003, Santa Clara, California, USA /

Publicat 2003

Llibre

7

Photonics packaging and integration III : 28-30 January, 2003, San Jose, California, USA /

Publicat 2003

Llibre

8

VLSI circuits and systems : 19-21 May, 2003, Maspalomas, Gran Canaria, Spain /

Publicat 2003

Actes de congresos Llibre

9

Physics and technology of crystalline oxide semiconductor CAAC-IGZO.

per Yamazaki, Shunpei, 1942-, Fujita, Masahiro, 1956-
Publicat 2017

Llibre

10

Design technology co-optimization in the era of sub-resolution IC scaling /

per Liebmann, Lars W., Vaidyanathan, Kaushik, Pileggi, Lawrence, 1962-
Publicat 2016

Llibre

11

Introduction to metrology applications in IC manufacturing /

per Su, Bo, 1961-, Solecky, Eric, Vaid, Alok
Publicat 2015

Llibre

12

Advanced Ta-based diffusion barriers for Cu interconnects /

per Hübner, René
Publicat 2009

Llibre

13

Radio frequency integrated circuits and technologies /

per Ellinger, Frank, 1972-
Publicat 2008

Llibre

14

System-level design with Rosetta /

per Alexander, Perry
Publicat 2007

Llibre

15

Gate stack scaling : materials, role of interfaces, and reliability implications : April 17-21, 2006, San Francisco, California, USA.

Publicat 2006

Llibre

16

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March, 2003 /

Publicat 2003

Actes de congresos Llibre

17

Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A /

Publicat 2004

Actes de congresos Llibre

18

Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA /

Publicat 2004

Llibre

19

Formal methods in computer-aided design : 5th international confrence [i.e. conference], FMCAD 2004, Austin, Texas, USA, November 15-17, 2004 ; proceedings /

Publicat 2004

Actes de congresos Llibre

20

Dimension reduction of large-scale systems : proceedings of a workshop held in Oberwolfach, Germany, October 19-25, 2003 /

Publicat 2005

Llibre

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