Arama Sonuçları

1

EDA for IC implementation, circuit design, and process technology /

Baskı/Yayın Bilgisi 2006

Kitap

2

EDA for IC system design, verification, and testing /

Baskı/Yayın Bilgisi 2006

Kitap

3

Fundamentals of semiconductor manufacturing and process control /

Yazar: May, Gary S.
Baskı/Yayın Bilgisi 2006

Kitap

4

Motion estimation for video coding : efficient algorithms and architectures /

Yazar: Chakrabarti, Indrajit, Batta, Kota Naga Srinivasarao, Chatterjee, Sumit Kumar
Baskı/Yayın Bilgisi 2015

Kitap

5

19th European Conference on Mask Technology for Integrated Circuits and Microcomponents, 13-15 January, 2003, Sonthofen, Germany /

Baskı/Yayın Bilgisi 2003

Konferans Sunumu Kitap

6

Metrology, inspection, and process control for microlithography XVII : 24-27 February, 2003, Santa Clara, California, USA /

Baskı/Yayın Bilgisi 2003

Kitap

7

Photonics packaging and integration III : 28-30 January, 2003, San Jose, California, USA /

Baskı/Yayın Bilgisi 2003

Kitap

8

VLSI circuits and systems : 19-21 May, 2003, Maspalomas, Gran Canaria, Spain /

Baskı/Yayın Bilgisi 2003

Konferans Sunumu Kitap

9

Physics and technology of crystalline oxide semiconductor CAAC-IGZO.

Yazar: Yamazaki, Shunpei, 1942-, Fujita, Masahiro, 1956-
Baskı/Yayın Bilgisi 2017

Kitap

10

Design technology co-optimization in the era of sub-resolution IC scaling /

Yazar: Liebmann, Lars W., Vaidyanathan, Kaushik, Pileggi, Lawrence, 1962-
Baskı/Yayın Bilgisi 2016

Kitap

11

Introduction to metrology applications in IC manufacturing /

Yazar: Su, Bo, 1961-, Solecky, Eric, Vaid, Alok
Baskı/Yayın Bilgisi 2015

Kitap

12

Advanced Ta-based diffusion barriers for Cu interconnects /

Yazar: Hübner, René
Baskı/Yayın Bilgisi 2009

Kitap

13

Radio frequency integrated circuits and technologies /

Yazar: Ellinger, Frank, 1972-
Baskı/Yayın Bilgisi 2008

Kitap

14

System-level design with Rosetta /

Yazar: Alexander, Perry
Baskı/Yayın Bilgisi 2007

Kitap

15

Gate stack scaling : materials, role of interfaces, and reliability implications : April 17-21, 2006, San Francisco, California, USA.

Baskı/Yayın Bilgisi 2006

Kitap

16

Characterization and metrology for ULSI technology : 2003 International Conference on Characterization and Metrology for ULSI Technology, Austin, Texas, 24-28 March, 2003 /

Baskı/Yayın Bilgisi 2003

Konferans Sunumu Kitap

17

Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A /

Baskı/Yayın Bilgisi 2004

Konferans Sunumu Kitap

18

Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA /

Baskı/Yayın Bilgisi 2004

Kitap

19

Formal methods in computer-aided design : 5th international confrence [i.e. conference], FMCAD 2004, Austin, Texas, USA, November 15-17, 2004 ; proceedings /

Baskı/Yayın Bilgisi 2004

Konferans Sunumu Kitap

20

Dimension reduction of large-scale systems : proceedings of a workshop held in Oberwolfach, Germany, October 19-25, 2003 /

Baskı/Yayın Bilgisi 2005

Kitap

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