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Priporočene teme:
Defects
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Testing
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Integrated circuits
Institucija:
Rensselaer Polytechnic Institute
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Priporočene teme:
Defects
IN
Testing
IN
Integrated circuits
Institucija:
Rensselaer Polytechnic Institute
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Circuits intégrés à très grande échelle
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From contamination to defects, faults, and yield loss : simulation and applications /
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Khare, Jitendra B.
Izdano 1996
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Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California /
Izdano 1998
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Circuits intégrés à très grande échelle
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Defects
Défauts
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Integrated circuits
Integrierte Schaltung
2
Testing
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Very large scale integration
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Circuits intégrés
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Computer simulation
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Computer-Aided Design
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Computer-aided design
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Fehlersimulation
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Kongress
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