Semiconductor measurement technology : EPROP, an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon /

Bibliographic Details
Main Author: Seabaugh, Alan Carter
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Mathias, John J., Bell, Michael I.
Format: Government Document Book
Language:English
Published: Gaithersburg, MD : [Springfield, VA] : U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service], 1990.
Series:NIST special publication ; 400-85.
Semiconductor measurement technology.
Subjects: