Semiconductor measurement technology : EPROP, an interactive FORTRAN program for computing selected electronic properties of gallium arsenide and silicon /
| Hovedforfatter: | |
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| Institution som forfatter: | |
| Andre forfattere: | , |
| Format: | Government Document Bog |
| Sprog: | English |
| Udgivet: |
Gaithersburg, MD : [Springfield, VA] :
U.S. Dept. of Commerce, National Institute of Standards and Technology ; [Order from National Technical Information Service],
1990.
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| Serier: | NIST special publication ;
400-85. Semiconductor measurement technology. |
| Fag: |