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Bibliographic Details
Corporate Authors:
IEEE Symposium on Computer Software Reliability New York
,
Association for Computing Machinery
,
Institute of Electrical and Electronics Engineers
,
Institute of Electrical and Electronics Engineers. Long Island Section
Format:
Conference Proceeding
Book
Language:
English
Published:
New York :
Institute of Electrical and Electronics Engineers,
©1973.
Subjects:
Computer programs
>
Reliability
>
Congresses.
Computer programs
>
Testing
>
Congresses.
Debugging in computer science
>
Congresses.
Logiciels
>
Fiabilité
>
Congrès.
Logiciels
>
Essais
>
Congrès.
Débogage
>
Congrès.
Computer programs
>
Reliability.
Computer programs
>
Testing.
Debugging in computer science.
Computadores (Software)
DATA PROCESSING.
CONFERENCES.
COMPUTER PROGRAMS.
Conference papers and proceedings.
Holdings
Description
Other Versions (5)
Staff View
RPI
Holdings details from RPI
Call Number:
QA 76.76 R44 I43x 1973
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