Semiconductor measurement technology : Measurement of transistor scattering parameters /

Bibliographic Details

Main Authors:	Rogers, George J. (Author), Sawyer, David E. (Author), Jesch, Ramon L. (Author)
Format:	Government Document Book
Language:	English
Published:	[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
Series:	Semiconductor measurement technology. NBS special publication ; 400-5.
Subjects:	Transistors > Testing. Electronic measurements. Mesures électroniques. Transistors > Mesure.