Visualization and data analysis 2004 : 19-20 January 2004, San Jose, California, USA /
Corporate Authors: | , |
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Other Authors: | |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash., USA :
SPIE,
©2004.
|
Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5295. |
Subjects: |
RPI
Call Number: |
QA76.9.D3 V59 2004 |
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