Independent component analyses, wavelets, and neural networks : 22-25 April, 2003, Orlando, Florida, USA /
Corporate Author: | |
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Other Authors: | , , |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash. :
SPIE,
©2003.
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Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5102. |
Subjects: |
RPI
Call Number: |
QA278 .I53 2003 |
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