Forensic psychology and psychiatry /

Bibliographic Details

Corporate Authors:	New York Academy of Sciences, National Institute of Law Enforcement and Criminal Justice
Other Authors:	Wright, Fred, 1935-, Bahn, Charles, Rieber, R. W. (Robert W.)
Format:	Book
Language:	English
Published:	New York, N.Y. : New York Academy of Sciences, 1980.
Series:	Annals of the New York Academy of Sciences ; v. 347.
Subjects:	Psychology, Forensic > Congresses. Forensic psychiatry > Congresses. Conference papers and proceedings.