Search Results

21

NBS/FDA workshop : reliability technology for cardiac pacemakers /

Published 1976

Government Document Book

22

Method for determining the resolving power of photographic lenses /

by Washer, Francis E., Gardner, Irvine C. (Irvine Clifton), 1889-
Published 1973

Government Document Book

23

Standard reference materials : selection of differential thermal analysis temperature standards through a cooperative study (SRM 758, 759, 760)

by McAdie, H. G., Garn, Paul D., Menis, Oscar, 1913-1979
Published 1972

Government Document Book

24

Standard reference materials and meaningful measurements : proceedings of the 6th Materials Research Symposium /

Published 1975

Government Document Conference Proceeding Book

25

ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] /

by Schafft, Harry A.
Published 1974

Government Document Book

26

Standard reference materials : Eddy current decay method for resistivity characterization of high purity metals /

Published 1972

Government Document Book

27

Guide to software acceptance /

by Wallace, Dolores R.
Published 1990

Government Document Book

28

Design and testing guides for the CMOS and lateral bipolar-on-SOI test library /

by Marshall, J. C. (Janet C.)
Published 1994

Government Document Book

29

Development of a testing methodology to predict optical disk life expectancy values /

by Podio, Fernando L.
Published 1991

Government Document Book

30

Test methods for optical disk media characteristics : for 356 mm ruggedized magneto-optic media /

Published 1991

Government Document Book

31

Comprehensive test pattern and approach for characterizing SOS technology /

by Ham, W. E. (William E.)
Published 1980

Government Document Book

32

Modulation measurements for microwave mixers /

by Kenney, James M.
Published 1980

Government Document Book

33

An approach to improved durability tests for building materials and components /

by Frohnsdorff, Geoffrey, Masters, Larry W., Martin, Jonathan W.
Published 1980

Government Document Book

34

A manual wafer probe station for an integrated circuit test system /

by Carver, G. P.
Published 1981

Government Document Book

35

Structured testing : a testing methodology using the cyclomatic complexity metric /

by Watson, Arthur Henry, 1964-, Wallace, Dolores R., McCabe, Thomas J., 1941-
Published 1996

Government Document Book

36

ARPA/NBS workshop III : test patterns for integrated circuits /

by Schafft, Harry A.
Published 1976

Government Document Book

37

Standard reference materials : viscosity of a standard lead-silica glass

by Napolitano, A., Hawkins, E. G. (Earl G.)
Published 1966

Government Document Book

38

Validating the correctness of hardware implementations of the NBS data encryption standard Jason Gait.

by Gait, Jason
Published 1977

Government Document Book

39

Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques /

by Harman, George G.
Published 1979

Government Document Book

40

Micro-homogeneity studies of NBS standard reference materials, NBS research materials, and other related samples /

by Marinenko, R. B., Heinrich, Kurt F. J., Ruegg, F. C.
Published 1979

Government Document Book

Narrow Search