Search Results

1

MFPG--mechanical failure: definition of the problem : proceedings of the 20th meeting of the Mechanical Failures Prevention Group, held at the the National Bureau of Standards, Was...

Published 1976

Government Document Book

2

A laser scanner for semiconductor devices /

by Sawyer, David E., Berning, David W.
Published 1977

Government Document Book

3

A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /

by Goodman, Alvin M.
Published 1977

Government Document Book

4

Validating the Correctness of Hardware Implementation of the NBS Data Encryption Standard /

by Gait, Jason
Published 1977

Government Document Book

5

Test Method for the Evaluation of Metallic Window Foil for Intrusion Alarm Systems /

by Stenbakken, Gerard N.
Published 1978

Government Document Book

6

A production-compatible microelectronic test pattern for evaluating photomask misalignment /

by Russell, T. J. (Thomas James), 1943-, Maxwell, Dwight A.
Published 1979

Government Document Book

7

Semiconductor measurement technology : spreading resistance analysis for silicon layers with nonuniform resistivity /

by Dickey, David H.
Published 1979

Government Document Book

8

Standard reference materials : Viscosity of a standard borosilicate glass (certification of standard reference material 717) /

by Napolitano, A., Hawkins, E. G. (Earl G.)
Published 1970

Government Document Book

9

MFPG--detection, diagnosis, and prognosis : proceedings of the 22nd meeting of the Mechanical Failures Prevention Group, held at Anaheim, California ... April 23-25, 1975 /

Published 1975

Government Document Book

10

The Destructive bond pull test /

Published 1976

Government Document Book

11

A versatile high-voltage bias supply for extended range MIS C(V) and G(V) measurements /

by Kuczer, Paul, Hook, Harvey O., Goodman, Alvin M.
Published 1977

Government Document Book

12

Microelectronic test pattern NBS-4 /

by Thurber, W. Robert
Published 1978

Government Document Book

13

Semiconductor measurement technology : Measurement of transistor scattering parameters /

by Rogers, George J., Sawyer, David E., Jesch, Ramon L.
Published 1975

Government Document Book

14

Planar test structures for characterizing impurities in silicon /

Published 1976

Government Document Book

15

Spreading Resistance Symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 /

Published 1974

Government Document Conference Proceeding Book

16

Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics /

by Christou, A.
Published 1978

Government Document Book

17

A reverse-bias safe operating area transistor tester /

by Berning, David W.
Published 1979

Government Document Book

18

Metrology for submicrometer devices and circuits /

by Bullis, W. Murray, 1930-
Published 1980

Government Document Book

19

Techniques for measuring the integrity of passivation overcoats on integrated circuits /

by Kern, Werner, 1925-, Comizzoli, Robert B.
Published 1977

Government Document Book

20

Safe operating area limits for power transistors /

by Blackburn, David L.
Published 1977

Government Document Book

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