Scattering and surface roughness II : 21-23 July 1998, San Diego, California /
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| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash. :
Society of Photo-optical Instrumentation Engineers,
©1998.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 3426. |
| Subjects: |