X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California /
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| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE--the International Society for Optical Engineering,
©1986.
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 690. |
| Subjects: |