Made to measure : UMS-Pastoe and Cees Braakman, 1948-1968 /

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Bibliographic Details
Main Author: Kuyper, Daan de
Corporate Author: R Gallery (New York, N.Y.)
Format: Book
Language:English
Published: New York : R Gallery, [c2000]
Subjects:

Pratt Institute

Holdings details from Pratt Institute

RIT

Holdings details from RIT
Call Number: NK2570.U45 A4 2000